Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/202149
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dc.titleThe Charge-Based Flicker Noise Model for HEMTs
dc.contributor.authorHAORUI LUO
dc.contributor.authorXU YAN
dc.contributor.authorWENRUI HU
dc.contributor.authorYONGXIN GUO
dc.date.accessioned2021-10-07T01:07:43Z
dc.date.available2021-10-07T01:07:43Z
dc.date.issued2021
dc.identifier.citationHAORUI LUO, XU YAN, WENRUI HU, YONGXIN GUO (2021). The Charge-Based Flicker Noise Model for HEMTs. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/202149
dc.publisherIEEE
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.typeArticle
dc.contributor.departmentDEPT OF ELECTRICAL & COMPUTER ENGG
dc.description.codenIEEE Microwave and Wireless Components Letters
dc.published.stateUnpublished
dc.grant.idNRF–CRP17–2017–08
dc.grant.fundingagencyNational Research Foundation, Singapore
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