Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/202049
Title: Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
Authors: SIPING GAO
IURII CHERUKHIN 
YONGXIN GUO
Issue Date: 4-Oct-2021
Publisher: IEEE
Citation: SIPING GAO, IURII CHERUKHIN, YONGXIN GUO (2021-10-04). Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method. ScholarBank@NUS Repository.
Rights: Attribution-NonCommercial-NoDerivatives 4.0 International
URI: https://scholarbank.nus.edu.sg/handle/10635/202049
Rights: Attribution-NonCommercial-NoDerivatives 4.0 International
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