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Title: | SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) | Authors: | WU HAIJUN | ORCID iD: | orcid.org/0000-0002-7303-379X | Keywords: | aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface | Issue Date: | 11-Jan-2019 | Citation: | WU HAIJUN (2019-01-11). SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM). ScholarBank@NUS Repository. | Abstract: | Controlling and tuning of structural defects in crystalline materials can lead to marked improvements in their functional properties. Aberration-corrected scanning transmission electron microscopy (STEM) has developed into the most powerful characterization and even fabrication platform for all materials, especially for functional materials with complex structural features that dynamically respond to external fields. Directly seeing and tuning all scales of defects has now become possible, including the critically important atomic-scale defects. Thoroughly understanding the nature and role of structural defects not only reveals the origin of the structure-property relations of existing high-performance materials, but more importantly, enables us to foresee new pathways to the design of new materials with enhanced properties. In this thesis, we will show the achievements and new insights obtained from representative functional materials, including piezoelectrics/ferroelectrics, functional oxide interfaces, thermoelectrics, and electrocatalysts. We highlight a universal strategy to optimize the properties of these functional materials, atomic-scale defect engineering. | URI: | https://scholarbank.nus.edu.sg/handle/10635/186832 |
Appears in Collections: | Ph.D Theses (Open) |
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PhD thesis_WU Haijun_revision_final.pdf | 11.42 MB | Adobe PDF | OPEN | None | View/Download |
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