AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/182247

DC Field	Value
dc.title	AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
dc.contributor.author	VINCENT ONG KENG SIAN
dc.date.accessioned	2020-10-30T06:42:55Z
dc.date.available	2020-10-30T06:42:55Z
dc.date.issued	1997
dc.identifier.citation	VINCENT ONG KENG SIAN (1997). AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES. ScholarBank@NUS Repository.
dc.identifier.uri	https://scholarbank.nus.edu.sg/handle/10635/182247
dc.source	CCK BATCHLOAD 20201023
dc.type	Thesis
dc.contributor.department	ELECTRICAL ENGINEERING
dc.contributor.supervisor	JACOB PHANG CHEE HONG
dc.contributor.supervisor	DANIEL CHAN SIU HUNG
dc.description.degree	Ph.D
dc.description.degreeconferred	DOCTOR OF PHILOSOPHY
Appears in Collections:	Ph.D Theses (Restricted)

File	Description	Size	Format	Access Settings	Version
b20158464.pdf		10.03 MB	Adobe PDF	RESTRICTED	None	Log In

Check