Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/182247
DC Field | Value | |
---|---|---|
dc.title | AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES | |
dc.contributor.author | VINCENT ONG KENG SIAN | |
dc.date.accessioned | 2020-10-30T06:42:55Z | |
dc.date.available | 2020-10-30T06:42:55Z | |
dc.date.issued | 1997 | |
dc.identifier.citation | VINCENT ONG KENG SIAN (1997). AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES. ScholarBank@NUS Repository. | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/182247 | |
dc.source | CCK BATCHLOAD 20201023 | |
dc.type | Thesis | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.contributor.supervisor | JACOB PHANG CHEE HONG | |
dc.contributor.supervisor | DANIEL CHAN SIU HUNG | |
dc.description.degree | Ph.D | |
dc.description.degreeconferred | DOCTOR OF PHILOSOPHY | |
Appears in Collections: | Ph.D Theses (Restricted) |
Show simple item record
Files in This Item:
File | Description | Size | Format | Access Settings | Version | |
---|---|---|---|---|---|---|
b20158464.pdf | 10.03 MB | Adobe PDF | RESTRICTED | None | Log In |
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.