Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/180234
DC Field | Value | |
---|---|---|
dc.title | A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES | |
dc.contributor.author | GOO KAH HEONG | |
dc.date.accessioned | 2020-10-26T07:32:08Z | |
dc.date.available | 2020-10-26T07:32:08Z | |
dc.date.issued | 1999 | |
dc.identifier.citation | GOO KAH HEONG (1999). A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES. ScholarBank@NUS Repository. | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/180234 | |
dc.source | CCK BATCHLOAD 20201023 | |
dc.type | Thesis | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.contributor.supervisor | LING CHUNG HO | |
dc.description.degree | Master's | |
dc.description.degreeconferred | MASTER OF ENGINEERING | |
Appears in Collections: | Master's Theses (Restricted) |
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