Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/180234
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dc.titleA STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
dc.contributor.authorGOO KAH HEONG
dc.date.accessioned2020-10-26T07:32:08Z
dc.date.available2020-10-26T07:32:08Z
dc.date.issued1999
dc.identifier.citationGOO KAH HEONG (1999). A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/180234
dc.sourceCCK BATCHLOAD 20201023
dc.typeThesis
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.supervisorLING CHUNG HO
dc.description.degreeMaster's
dc.description.degreeconferredMASTER OF ENGINEERING
Appears in Collections:Master's Theses (Restricted)

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