Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/177258
Title: SINGLE CONTACT OPTICAL BEAM INDUCED CURRENTS (SCOBIC)
Authors: CHIN JIANN MIN
Keywords: Optical beam induced current
single contact effects
parasitic capacitance
space charge regions
failure analysis
laser beam
Issue Date: 1999
Citation: CHIN JIANN MIN (1999). SINGLE CONTACT OPTICAL BEAM INDUCED CURRENTS (SCOBIC). ScholarBank@NUS Repository.
Abstract: The Single Contact Optical Beam Induced Currents (SCOBIC) technique is developed to overcome the limitation of the conventional beam induced current techniques. Single contact effects can be observed when only one terminal of the space charge region in a semiconductor device is connected to the preamplifier. In this configuration, a parasitic capacitance exists between the unconnected terminal and ground, thereby completing the transient current path. Experiments performed demonstrate the validity of the SCOBIC results in comparison with equivalent OBIC results. By connecting the substrate of an integrated circuit to the current amplifier, many junctions can be imaged. In contrast, in the OBIC technique, only the junction directly connected to the current amplifier is imaged.
URI: https://scholarbank.nus.edu.sg/handle/10635/177258
Appears in Collections:Master's Theses (Restricted)

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