Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4927769
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dc.titleSize dependence of spin-wave modes in Ni80Fe20 nanodisks
dc.contributor.authorLupo, P
dc.contributor.authorKumar, D
dc.contributor.authorAdeyeye, A.O
dc.date.accessioned2020-09-14T08:16:53Z
dc.date.available2020-09-14T08:16:53Z
dc.date.issued2015
dc.identifier.citationLupo, P, Kumar, D, Adeyeye, A.O (2015). Size dependence of spin-wave modes in Ni80Fe20 nanodisks. AIP Advances 5 (7) : 77179. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4927769
dc.identifier.issn2158-3226
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/176146
dc.description.abstractWe investigate the radial and azimuthal spin-wave (SW) resonance modes in permalloy (Py: Ni80Fe20) disks at zero external magnetic field, as function of disk diameter and thickness, using broadband ferromagnetic resonance spectroscopy. We observed, from both experimental and micromagnetic simulation results that the number of SW absorption peaks increases with disk diameter. Numerically calculated SW mode profiles revealed a characteristic minimum size, which does not scale proportionately with the increasing disk diameter. We show that higher order modes could thus be avoided with an appropriate choice of the disk diameter (smaller than the minimum mode size). Moreover, based on the mode profiles, the existence of azimuthal SW modes with even number of crests or troughs can be ruled out. These results could be useful in enhancing our fundamental understanding as well as engineering of new magnonic devices. © 2015 Author(s).
dc.sourceUnpaywall 20200831
dc.subjectBinary alloys
dc.subjectFerromagnetic resonance
dc.subjectNickel alloys
dc.subjectSilicon alloys
dc.subjectSpin waves
dc.subjectAbsorption peaks
dc.subjectBroadband ferromagnetic resonance
dc.subjectExternal magnetic field
dc.subjectHigher-order modes
dc.subjectMicromagnetic simulations
dc.subjectResonance mode
dc.subjectSize dependence
dc.subjectSpin-wave mode
dc.subjectIron alloys
dc.typeArticle
dc.contributor.departmentDEPT OF ELECTRICAL & COMPUTER ENGG
dc.description.doi10.1063/1.4927769
dc.description.sourcetitleAIP Advances
dc.description.volume5
dc.description.issue7
dc.description.page77179
dc.published.statePublished
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