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https://doi.org/10.1117/1.JMM.16.3.034501
Title: | Low-power, low-pressure reactive-ion etching process for silicon etching with vertical and smooth walls for mechanobiology application | Authors: | Ashraf, M Sundararajan, S.V Grenci, G |
Keywords: | Aspect ratio Etching Inductively coupled plasma Ions Lithography Molds Photoresists Silicon oxides Elastomeric materials Etching process Mechano-biology Pattern transfers Silicon etching Silicon substrates Soft-lithographic techniques Vertical profile Reactive ion etching |
Issue Date: | 2017 | Citation: | Ashraf, M, Sundararajan, S.V, Grenci, G (2017). Low-power, low-pressure reactive-ion etching process for silicon etching with vertical and smooth walls for mechanobiology application. Journal of Micro/ Nanolithography, MEMS, and MOEMS 16 (3) : 34501. ScholarBank@NUS Repository. https://doi.org/10.1117/1.JMM.16.3.034501 | Abstract: | We report our findings in developing a low-power etching recipe using a newly acquired reactive-ion etching (RIE) tool (RIE-10NR, Samco, Japan), with the aim of achieving smooth and vertical sidewalls in micropatterned silicon substrate. We used a combination of CF4, SF6, and O2 gases, which at low power (30 W) and low pressure (2 Pa) allowed for vertical silicon etching (aspect ratio ?2). We used photoresist and silicon oxide as the etching masks. As it is a continuous etching process, scalloping effects were not present, which is contrary to the process done with an inductively coupled plasma-based "Bosch" approach. We also show a successful use of these microstructures as master mold in soft-lithographic techniques for producing devices in elastomeric materials that have applications in mechanobiology. To the best of our knowledge, the recipe we present here has the lowest combination of power and pressure for etching silicon with vertical profile using a standard, parallel plates RIE tool. © 2017 The Authors. | Source Title: | Journal of Micro/ Nanolithography, MEMS, and MOEMS | URI: | https://scholarbank.nus.edu.sg/handle/10635/173783 | ISSN: | 19325150 | DOI: | 10.1117/1.JMM.16.3.034501 |
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