Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/172118
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dc.titleA SPECTROSCOPIC PHOTOEMISSION MICROSCOPY SYSTEM FOR SEMICONDUCTOR DEVICE ANALYSIS
dc.contributor.authorKOH LIAN-SER
dc.date.accessioned2020-08-07T09:22:05Z
dc.date.available2020-08-07T09:22:05Z
dc.date.issued1995
dc.identifier.citationKOH LIAN-SER (1995). A SPECTROSCOPIC PHOTOEMISSION MICROSCOPY SYSTEM FOR SEMICONDUCTOR DEVICE ANALYSIS. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/172118
dc.sourceCCK BATCHLOAD 20200814
dc.typeThesis
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.supervisorJACOB PHANG CHEE HONG
dc.contributor.supervisorDANIEL CHAN SIU HUNG
dc.contributor.supervisorCHIM WAI KIN
dc.description.degreeMaster's
dc.description.degreeconferredMASTER OF ENGINEERING
Appears in Collections:Master's Theses (Restricted)

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