Please use this identifier to cite or link to this item: https://doi.org/10.1109/JPHOTOV.2020.3001720
Title: Comparative Study of the Electrical Parameters of Individual Solar Cells in a c-Si Module Extracted Using Indoor and Outdoor Electroluminescence Imaging
Authors: Amit Singh Rajput 
Yin Zhang 
Carlos D. Rodriguez-Gallegos 
Ankit Khanna 
Prabir Kanti Basu 
Srinath Nalluri 
Jai Prakash Singh 
Keywords: CRYSTALLINE SILICON
Daytime luminescence imaging
Electroluminescence (EL)
Outdoor measurements
Photovoltaic (PV) modules
Issue Date: 6-Jul-2020
Publisher: IEEE Journal of Photovoltaics
Citation: Amit Singh Rajput, Yin Zhang, Carlos D. Rodriguez-Gallegos, Ankit Khanna, Prabir Kanti Basu, Srinath Nalluri, Jai Prakash Singh (2020-07-06). Comparative Study of the Electrical Parameters of Individual Solar Cells in a c-Si Module Extracted Using Indoor and Outdoor Electroluminescence Imaging. ScholarBank@NUS Repository. https://doi.org/10.1109/JPHOTOV.2020.3001720
Abstract: In this article, electroluminescence (EL) imaging is applied to characterize monocrystalline silicon photovoltaic (PV) modules under indoor and outdoor conditions. EL images of PV modules are analyzed to extract dark saturation current density and series resistance for individual cells within the module. These individual solar cells’ parameters together with the terminal voltages of the modules, are used to model the current–voltage (I–V) characteristics of individual cells and the module using the one-diode model of solar cells and LTspice. We have explored the method for both indoor and outdoor EL images and compared the results with indoor I–V measurements under standard test conditions (STC). The electrical parameters of the PV module estimated using this approach for both, indoor and outdoor EL measurements are in good agreement with a relatively small deviation of less than 3% from the reference measurements performed under STC. This method is particularly useful to extract the electrical parameter and information on module degradation in the field using the EL only, without performing an I–V measurement.
URI: https://scholarbank.nus.edu.sg/handle/10635/171578
ISSN: 21563381
DOI: 10.1109/JPHOTOV.2020.3001720
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