Please use this identifier to cite or link to this item: https://doi.org/10.1002/adma.201501086
Title: Rapid and Nondestructive Identification of Polytypism and Stacking Sequences in Few-Layer Molybdenum Diselenide by Raman Spectroscopy
Authors: Lu, Xin 
Utama, M Iqbal Bakti
Lin, Junhao
Luo, Xin 
Zhao, Yanyuan
Zhang, Jun
Pantelides, Sokrates T
Zhou, Wu
Quek, Su Ying 
Xiong, Qihua
Keywords: Science & Technology
Physical Sciences
Technology
Chemistry, Multidisciplinary
Chemistry, Physical
Nanoscience & Nanotechnology
Materials Science, Multidisciplinary
Physics, Applied
Physics, Condensed Matter
Chemistry
Science & Technology - Other Topics
Materials Science
Physics
Few layer MoSe2
Interlayer shear mode
Molybdenum diselenide
Polytypism
Stacking
ELECTRONIC-STRUCTURE
VALLEY POLARIZATION
MONOLAYER MOS2
BILAYER MOS2
FILMS
Issue Date: 12-Aug-2015
Publisher: WILEY-V C H VERLAG GMBH
Citation: Lu, Xin, Utama, M Iqbal Bakti, Lin, Junhao, Luo, Xin, Zhao, Yanyuan, Zhang, Jun, Pantelides, Sokrates T, Zhou, Wu, Quek, Su Ying, Xiong, Qihua (2015-08-12). Rapid and Nondestructive Identification of Polytypism and Stacking Sequences in Few-Layer Molybdenum Diselenide by Raman Spectroscopy. ADVANCED MATERIALS 27 (30) : 4502-4508. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.201501086
Abstract: © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Various combinations of interlayer shear modes emerge in few-layer molybdenum diselenide grown by chemical vapor deposition depending on the stacking configuration of the sample. Raman measurements may also reveal polytypism and stacking faults, as supported by first principles calculations and high-resolution transmission electron microscopy. Thus, Raman spectroscopy is an important tool in probing stacking-dependent properties in few-layer 2D materials.
Source Title: ADVANCED MATERIALS
URI: https://scholarbank.nus.edu.sg/handle/10635/170916
ISSN: 09359648
15214095
DOI: 10.1002/adma.201501086
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