Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/168778
DC Field | Value | |
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dc.title | INVESTIGATION AND MITIGATION OF LIGHT AND ELEVATED TEMPERATURE INDUCED DEGRADATION IN MULTICRYSTALLINE SILICON SOLAR CELLS. | |
dc.contributor.author | ROMIKA SHARMA | |
dc.date.accessioned | 2020-05-31T18:00:23Z | |
dc.date.available | 2020-05-31T18:00:23Z | |
dc.date.issued | 2020-01-15 | |
dc.identifier.citation | ROMIKA SHARMA (2020-01-15). INVESTIGATION AND MITIGATION OF LIGHT AND ELEVATED TEMPERATURE INDUCED DEGRADATION IN MULTICRYSTALLINE SILICON SOLAR CELLS.. ScholarBank@NUS Repository. | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/168778 | |
dc.description.abstract | The efficiency of p-type multicrystalline silicon (multi-Si) PERC (passivated emitter and rear cell) solar cells is degraded upon exposure to 1-sun illumination at a temperature of above 50°C. This degradation effect aggravates at elevated temperature and is referred to as “light and elevated temperature induced degradation” (LeTID). LeTID is a serious cause of concern for the photovoltaic industry, as it can result in PERC cell efficiency losses as high as 6-14% (relative). Although several studies have been published on this problem in recent years, LeTID in multi-Si PERC solar cells is not yet well understood. Thus, this thesis studies the characteristics, kinetics and mitigation strategies of LeTID of multi-Si PERC solar cells. First, the characteristics and kinetics of LeTID and regeneration in multi-Si PERC solar cells are investigated. Methods to accelerate and annihilate the LeTID defect in the test environment are identified. Subsequently, mitigation strategies for LeTID in multi-Si PERC solar cells are proposed. Lastly, the impact of metallic impurities and hydrogen in the degradation or regeneration phase of LeTID defect formation in multi-Si wafers PERC cells is studied for the root cause analysis. | |
dc.language.iso | en | |
dc.subject | Silicon solar cells, multicrystalline,PERC, Light and elevated temperature induced degradation (LeTID), carrier induced degradation (CID). | |
dc.type | Thesis | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.contributor.supervisor | Armin Gerhard Aberle | |
dc.contributor.supervisor | Jian Wei Ho | |
dc.description.degree | Ph.D | |
dc.description.degreeconferred | DOCTOR OF PHILOSOPHY (FOE) | |
dc.identifier.orcid | 0000-0003-3155-1254 | |
Appears in Collections: | Ph.D Theses (Open) |
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File | Description | Size | Format | Access Settings | Version | |
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SharmaR.pdf | 6.29 MB | Adobe PDF | OPEN | None | View/Download |
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