Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/168778
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dc.titleINVESTIGATION AND MITIGATION OF LIGHT AND ELEVATED TEMPERATURE INDUCED DEGRADATION IN MULTICRYSTALLINE SILICON SOLAR CELLS.
dc.contributor.authorROMIKA SHARMA
dc.date.accessioned2020-05-31T18:00:23Z
dc.date.available2020-05-31T18:00:23Z
dc.date.issued2020-01-15
dc.identifier.citationROMIKA SHARMA (2020-01-15). INVESTIGATION AND MITIGATION OF LIGHT AND ELEVATED TEMPERATURE INDUCED DEGRADATION IN MULTICRYSTALLINE SILICON SOLAR CELLS.. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/168778
dc.description.abstractThe efficiency of p-type multicrystalline silicon (multi-Si) PERC (passivated emitter and rear cell) solar cells is degraded upon exposure to 1-sun illumination at a temperature of above 50°C. This degradation effect aggravates at elevated temperature and is referred to as “light and elevated temperature induced degradation” (LeTID). LeTID is a serious cause of concern for the photovoltaic industry, as it can result in PERC cell efficiency losses as high as 6-14% (relative). Although several studies have been published on this problem in recent years, LeTID in multi-Si PERC solar cells is not yet well understood. Thus, this thesis studies the characteristics, kinetics and mitigation strategies of LeTID of multi-Si PERC solar cells. First, the characteristics and kinetics of LeTID and regeneration in multi-Si PERC solar cells are investigated. Methods to accelerate and annihilate the LeTID defect in the test environment are identified. Subsequently, mitigation strategies for LeTID in multi-Si PERC solar cells are proposed. Lastly, the impact of metallic impurities and hydrogen in the degradation or regeneration phase of LeTID defect formation in multi-Si wafers PERC cells is studied for the root cause analysis.
dc.language.isoen
dc.subjectSilicon solar cells, multicrystalline,PERC, Light and elevated temperature induced degradation (LeTID), carrier induced degradation (CID).
dc.typeThesis
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.supervisorArmin Gerhard Aberle
dc.contributor.supervisorJian Wei Ho
dc.description.degreePh.D
dc.description.degreeconferredDOCTOR OF PHILOSOPHY (FOE)
dc.identifier.orcid0000-0003-3155-1254
Appears in Collections:Ph.D Theses (Open)

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