Please use this identifier to cite or link to this item: https://doi.org/10.1002/adfm.201906655
Title: Correlated Lattice Instability and Emergent Charged Domain Walls at Oxide Heterointerfaces
Authors: Li, Mengsha
Huang, Zhen 
Tang, Chunhua 
Song, Dongsheng 
Mishra, Tara Prasad
Ariando, Ariando 
Venkatesan, Thirumalai 
Li, Changjian 
Pennycook, Stephen J. 
Keywords: Charged domain walls
Correlated systems
Nanoscale charge engineering
Oxygen octahedral rotation
STEM-EELS
Issue Date: 26-Sep-2019
Publisher: Wiley-VCH Verlag
Citation: Li, Mengsha, Huang, Zhen, Tang, Chunhua, Song, Dongsheng, Mishra, Tara Prasad, Ariando, Ariando, Venkatesan, Thirumalai, Li, Changjian, Pennycook, Stephen J. (2019-09-26). Correlated Lattice Instability and Emergent Charged Domain Walls at Oxide Heterointerfaces. ADVANCED FUNCTIONAL MATERIALS 29 (49). ScholarBank@NUS Repository. https://doi.org/10.1002/adfm.201906655
Abstract: Charged domain walls provide possibilities in effectively manipulating electrons at nanoscales for developing next-generation electronic devices. Here, using the atom-resolved imaging and spectroscopy on LaAlO3/SrTiO3//NdGaO3 heterostructures, the evolution of correlated lattice instability and charged domain walls is visualized crossing the conducting LaAlO3/SrTiO3 heterointerface. When increasing the SrTiO3 layer thickness to 20 unit cells and above, both LaAlO3 and SrTiO3 layers begin to exhibit measurable polar displacements to form a tail-to-tail charged domain wall at the LaAlO3/SrTiO3 interface, resulting in the charged redistribution within the 2-nm-thick SrTiO3 layer close to the LaAlO3/SrTiO3 interface. The mobile charges in different heterostructures can be estimated by summing up Ti3+ concentrations in the conducting channel, which is sandwiched by SrTiO3 layers with interdiffusion and/or oxygen octahedral rotations. Those estimated mobile charges are quantitatively consistent with results from Hall measurements. The results not only shed light on complex oxide heterointerfaces, but also pave a new path to nanoscale charge engineering. © 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Source Title: ADVANCED FUNCTIONAL MATERIALS
URI: https://scholarbank.nus.edu.sg/handle/10635/168503
ISSN: 1616301X
16163028
DOI: 10.1002/adfm.201906655
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