Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/159092
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dc.titleCHARACTERIZATION OF A LOW DIELECTRIC CONSTANT MATERIAL FOR MULTILEVEL INTERCONNECTS
dc.contributor.authorWANG CUIYANG
dc.date.accessioned2019-09-16T02:51:40Z
dc.date.available2019-09-16T02:51:40Z
dc.date.issued2000
dc.identifier.citationWANG CUIYANG (2000). CHARACTERIZATION OF A LOW DIELECTRIC CONSTANT MATERIAL FOR MULTILEVEL INTERCONNECTS. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/159092
dc.sourceCCK BATCHLOAD 20190911
dc.typeThesis
dc.contributor.departmentPHYSICS
dc.contributor.supervisorSHEN ZEXIANG
dc.contributor.supervisorZHENG JIAZHEN
dc.description.degreeMaster's
dc.description.degreeconferredMASTER OF SCIENCE
Appears in Collections:Master's Theses (Restricted)

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