Please use this identifier to cite or link to this item: https://doi.org/10.1364/oe.17.018271
Title: Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
Authors: NELSON, AJ
TOLEIKIS, S
CHAPMAN, H
BAJT, S
KRZYWINSKI, J
CHALUPSKY, J
JUHA, L
CIHELKA, J
HAJKOVA, V
VYSIN, L
BURIAN, T
KOZLOVA, M
FäUSTLIN, RR
NAGLER, B
VINKO, SM
WHITCHER, T 
DZELZAINIS, T
RENNER, O
SAKSL, K
KHORSAND, AR
HEIMANN, PA
SOBIERAJSKI, R
KLINGER, D
JUREK, M
PELKA, J
IWAN, B
ANDREASSON, J
TIMNEANU, N
FAJARDO, M
WARK, JS
RILEY, D
TSCHENTSCHER, T
HAJDU, J
LEE, RW
Issue Date: 28-Sep-2009
Publisher: The Optical Society
Citation: NELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW (2009-09-28). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express 17 (20) : 18271-18271. ScholarBank@NUS Repository. https://doi.org/10.1364/oe.17.018271
Source Title: Optics Express
URI: https://scholarbank.nus.edu.sg/handle/10635/155138
ISSN: 10944087
DOI: 10.1364/oe.17.018271
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