Please use this identifier to cite or link to this item:
https://doi.org/10.1364/oe.17.018271
| Title: | Soft x-ray free electron laser microfocus for exploring matter under extreme conditions | Authors: | NELSON, AJ TOLEIKIS, S CHAPMAN, H BAJT, S KRZYWINSKI, J CHALUPSKY, J JUHA, L CIHELKA, J HAJKOVA, V VYSIN, L BURIAN, T KOZLOVA, M FäUSTLIN, RR NAGLER, B VINKO, SM WHITCHER, T DZELZAINIS, T RENNER, O SAKSL, K KHORSAND, AR HEIMANN, PA SOBIERAJSKI, R KLINGER, D JUREK, M PELKA, J IWAN, B ANDREASSON, J TIMNEANU, N FAJARDO, M WARK, JS RILEY, D TSCHENTSCHER, T HAJDU, J LEE, RW |
Issue Date: | 28-Sep-2009 | Publisher: | The Optical Society | Citation: | NELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW (2009-09-28). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express 17 (20) : 18271-18271. ScholarBank@NUS Repository. https://doi.org/10.1364/oe.17.018271 | Source Title: | Optics Express | URI: | https://scholarbank.nus.edu.sg/handle/10635/155138 | ISSN: | 10944087 | DOI: | 10.1364/oe.17.018271 |
| Appears in Collections: | Staff Publications Elements |
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