Structural, microstructural, dilectric and ferroelectric properties of sol-gel grown advanced smart materials for device applications

Abstract

Recent improvements in material quality and contact technology for PZT-based materials system have led to a rapid progress in various devices. In this study, lead zirconate titanate Pb(Zr0.85Ti0.15)O3 popularly known as PZT(85/15), 3 mol percent lanthanum modified PZT, (PLZT, 3/85/15) along with lithium and cesium co-modified PLZT (PLLZT and PLCZT) respectively have been selected in this study. The XRD results study showed that no significant shift for the peaks of modified PZT. But the ferroelectric properties and dielectric properties of alkaline ion modified PLZT showed better results compared to PZT(85/15). This study showed the innovative properties of the PLLZT(3/1/85/15) and PLCZT(3/1/85/15) thin films coated on Pt/Ti/SiO2/Si. The observed of fully perovskite phase free from pyrochlore phase, fatigue-free behaviour, large nonvolatile charges and small coercive field (Ec) values showed that these two types of materials are very promising to be apply for future ferroelectric applications.