Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/154132
Title: YIELD MANAGEMENT SYSTEM IMPROVEMENT
Authors: WANG YANG
Keywords: yield management system
electrical sort testing
SRAM failure analysis
yield analysis database
Issue Date: 2003
Citation: WANG YANG (2003). YIELD MANAGEMENT SYSTEM IMPROVEMENT. ScholarBank@NUS Repository.
Abstract: Yield management system (YMS) is an essential component in the tool set of a modern wafer foundry. A well established yield management system will help semiconductor manufacturers to generate a revenue stream quickly. Currently in System on Silicon Manufacturing Company (SSMC), YMS i s not good enough. In this project, firstly a method of isolating yield loss mechanism for functional failure and a systematic method of SRAM cell failure analysis were developed. The methods have been used to a 0.15µm CMOS product. After that, a yield analysis database system was built to improve the yield management system in SSMC.
URI: https://scholarbank.nus.edu.sg/handle/10635/154132
Appears in Collections:Master's Theses (Restricted)

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