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https://scholarbank.nus.edu.sg/handle/10635/154132
| Title: | YIELD MANAGEMENT SYSTEM IMPROVEMENT | Authors: | WANG YANG | Keywords: | yield management system electrical sort testing SRAM failure analysis yield analysis database |
Issue Date: | 2003 | Citation: | WANG YANG (2003). YIELD MANAGEMENT SYSTEM IMPROVEMENT. ScholarBank@NUS Repository. | Abstract: | Yield management system (YMS) is an essential component in the tool set of a modern wafer foundry. A well established yield management system will help semiconductor manufacturers to generate a revenue stream quickly. Currently in System on Silicon Manufacturing Company (SSMC), YMS i s not good enough. In this project, firstly a method of isolating yield loss mechanism for functional failure and a systematic method of SRAM cell failure analysis were developed. The methods have been used to a 0.15µm CMOS product. After that, a yield analysis database system was built to improve the yield management system in SSMC. | URI: | https://scholarbank.nus.edu.sg/handle/10635/154132 |
| Appears in Collections: | Master's Theses (Restricted) |
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| Wang Yang_Wang Yang-Thesis.pdf | 748.26 kB | Adobe PDF | RESTRICTED | None | Log In |
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