CHARACTERIZATION OF POWERMOSFET

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/154057

DC Field	Value
dc.title	CHARACTERIZATION OF POWERMOSFET
dc.contributor.author	SOO HAW YUN
dc.date.accessioned	2019-05-13T07:56:31Z
dc.date.available	2019-05-13T07:56:31Z
dc.date.issued	2007
dc.identifier.citation	SOO HAW YUN (2007). CHARACTERIZATION OF POWERMOSFET. ScholarBank@NUS Repository.
dc.identifier.uri	https://scholarbank.nus.edu.sg/handle/10635/154057
dc.description.abstract	The process integration team deals with customer engineers, customers, process engineers, and suppliers to coordinate and manage technology transfers or new products. Their work involves a lot of planning, meeting schedules and solving performance and process issues. This particular project involves process development of a power Mosfet technology (trench Mosfet) for production in Chartered. This report summarizes the characterization efforts performed throughout the development process.
dc.source	SMA BATCHLOAD 20190422
dc.subject	Powermosfet
dc.subject	polysilicon void
dc.subject	trench mosfet
dc.subject	characterization
dc.type	Thesis
dc.contributor.department	SINGAPORE-MIT ALLIANCE
dc.contributor.supervisor	GAN CHEE LIP
dc.contributor.supervisor	TEO YEOW MENG
dc.contributor.supervisor	KIM HUNG JIN
dc.description.degree	Master's
dc.description.degreeconferred	MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS
dc.description.other	Dissertation Supervisors: 1. Assistant Professor Gan Chee Lip, NTU. 2. Mr. Teo Yeow Meng, Chartered. 3. Mr. Kim Hung Jin, Chartered
Appears in Collections:	Master's Theses (Restricted)

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