Please use this identifier to cite or link to this item: https://doi.org/10.1149/05701.1701ecst
Title: The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes
Authors: Kilner J.A.
Tellez Lozano H.
Burriel M.
Cook S. 
Druce J.
Issue Date: 2013
Publisher: Electrochemical Society Inc.
Citation: Kilner J.A., Tellez Lozano H., Burriel M., Cook S., Druce J. (2013). The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes. ECS Transactions 57 (1) : 1701-1708. ScholarBank@NUS Repository. https://doi.org/10.1149/05701.1701ecst
Abstract: The measurement of the mass transport and oxygen exchange in materials for SOFCs has been greatly aided by the use of ion beam analysis techniques. In particular this has focused on the use of Secondary Ion Mass Spectrometry (SIMS) to measure diffusion profiles of oxygen 18 in ceramics to determine the kinetics of the bulk transport of oxygen. A second ion beam technique, Low Energy Ion Scattering (LEIS) can provide important information about the composition of the outermost atomic layers of the same materials where the gas/solid oxygen exchange process is taking place. The application of the newer technique of LEIS to materials for air electrodes is discussed and the behaviour of some common perovskite materials is explored. � The Electrochemical Society.
Source Title: ECS Transactions
URI: http://scholarbank.nus.edu.sg/handle/10635/149263
ISSN: 19385862
DOI: 10.1149/05701.1701ecst
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

10
checked on Jul 11, 2020

WEB OF SCIENCETM
Citations

8
checked on Dec 26, 2018

Page view(s)

40
checked on Jul 10, 2020

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.