Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/14294
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dc.titleMicrowave device characterization
dc.contributor.authorMYAT MYITZU SOE
dc.date.accessioned2010-04-08T10:41:45Z
dc.date.available2010-04-08T10:41:45Z
dc.date.issued2004-10-29
dc.identifier.citationMYAT MYITZU SOE (2004-10-29). Microwave device characterization. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/14294
dc.description.abstractThe emerging applications of wireless communications call for an effective low-cost approach to the microwave and RF packaging so as to meet the demand of the commercial market place. To ensure a good package design, development of characterization techniques for surface mounted package is thus necessary so as to predict their parasitic behavior at Microwave and RF For the first time, a whole series of novel coplanar package adapters for multi-conductor transmission line characterization is designed. In this thesis, a systematic approach of on-wafer characterization of a TSSOP package is demonstrated. This method is verified by extracting the lumped element model and transmission line model of the package Leads, numerically and experimentally.
dc.language.isoen
dc.subjectsurface mounted package; multi-conductor transmission line; coplanar; characterization; lump element model;
dc.typeThesis
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.supervisorLEONG MOOK SENG
dc.contributor.supervisorOOI BAN LEONG
dc.description.degreeMaster's
dc.description.degreeconferredMASTER OF ENGINEERING
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Master's Theses (Open)

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