OPTICAL LOSS ANALYSIS OF SILICON WAFER BASED SOLAR CELLS AND MODULES

Abstract

A comprehensive loss analysis is crucial for identifying optical loss mechanisms and optimising PV devices. By analysing various Si wafer based PV devices with different structural complexities (Si wafer solar cells, Si wafer based PV modules, and III-V on Si tandem solar cells), this thesis focuses on developing appropriate characterization methods and simulation models for optical loss analysis. First, to understand the light trapping effect in textured Si solar cells, texture morphologies are characterized and modelled. Second, to quantify the lateral photon harvesting from the inactive areas in Si wafer based PV modules, a novel characterization method is developed, using luminescence imaging. Third, to improve III-V on Si tandem solar cells, an analytical model is developed that determines the most effective optimisation sequence. These methods and models are useful tools for analysing short-circuit current losses in Si wafer based solar cells and modules, and for significantly improving their PV efficiencies.