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Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.951016
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dc.titleMoment reversal characterization of thin magnetic film by VSM or AGFM
dc.contributor.authorShan, Z.S.
dc.contributor.authorXu, Y.
dc.contributor.authorWang, J.P.
dc.contributor.authorChong, T.C.
dc.contributor.authorMalhotra, S.S.
dc.contributor.authorStaffort, D.C.
dc.contributor.authorZhu, C.X.
dc.date.accessioned2016-11-29T01:20:38Z
dc.date.available2016-11-29T01:20:38Z
dc.date.issued2001-07
dc.identifier.citationShan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X. (2001-07). Moment reversal characterization of thin magnetic film by VSM or AGFM. IEEE Transactions on Magnetics 37 (4 I) : 1944-1946. ScholarBank@NUS Repository. https://doi.org/10.1109/20.951016
dc.identifier.issn00189464
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/131605
dc.description.abstractAn approach has been developed to determine the thermal stability factor (K uV*/k BT), switching volume (V*), anisotropy (K u), and dynamic coercivity (H C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO 2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/20.951016
dc.sourceScopus
dc.subjectAnisotropy
dc.subjectMoment-decay
dc.subjectSwitching volume
dc.subjectThermal stability factor
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/20.951016
dc.description.sourcetitleIEEE Transactions on Magnetics
dc.description.volume37
dc.description.issue4 I
dc.description.page1944-1946
dc.description.codenIEMGA
dc.identifier.isiut000170910900216
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