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|Title:||Moment reversal characterization of thin magnetic film by VSM or AGFM||Authors:||Shan, Z.S.
Thermal stability factor
|Issue Date:||Jul-2001||Citation:||Shan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X. (2001-07). Moment reversal characterization of thin magnetic film by VSM or AGFM. IEEE Transactions on Magnetics 37 (4 I) : 1944-1946. ScholarBank@NUS Repository. https://doi.org/10.1109/20.951016||Abstract:||An approach has been developed to determine the thermal stability factor (K uV*/k BT), switching volume (V*), anisotropy (K u), and dynamic coercivity (H C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO 2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.||Source Title:||IEEE Transactions on Magnetics||URI:||http://scholarbank.nus.edu.sg/handle/10635/131605||ISSN:||00189464||DOI:||10.1109/20.951016|
|Appears in Collections:||Staff Publications|
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