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https://doi.org/10.1109/20.951016
| Title: | Moment reversal characterization of thin magnetic film by VSM or AGFM | Authors: | Shan, Z.S. Xu, Y. Wang, J.P. Chong, T.C. Malhotra, S.S. Staffort, D.C. Zhu, C.X. |
Keywords: | Anisotropy Moment-decay Switching volume Thermal stability factor |
Issue Date: | Jul-2001 | Citation: | Shan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X. (2001-07). Moment reversal characterization of thin magnetic film by VSM or AGFM. IEEE Transactions on Magnetics 37 (4 I) : 1944-1946. ScholarBank@NUS Repository. https://doi.org/10.1109/20.951016 | Abstract: | An approach has been developed to determine the thermal stability factor (K uV*/k BT), switching volume (V*), anisotropy (K u), and dynamic coercivity (H C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO 2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data. | Source Title: | IEEE Transactions on Magnetics | URI: | http://scholarbank.nus.edu.sg/handle/10635/131605 | ISSN: | 00189464 | DOI: | 10.1109/20.951016 |
| Appears in Collections: | Staff Publications |
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