Please use this identifier to cite or link to this item:
https://doi.org/10.1109/20.951016
| Title: | Moment reversal characterization of thin magnetic film by VSM or AGFM | Authors: | Shan, Z.S. Xu, Y. Wang, J.P. Chong, T.C. Malhotra, S.S. Staffort, D.C. Zhu, C.X. |
Keywords: | Anisotropy Moment-decay Switching volume Thermal stability factor |
Issue Date: | Jul-2001 | Citation: | Shan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X. (2001-07). Moment reversal characterization of thin magnetic film by VSM or AGFM. IEEE Transactions on Magnetics 37 (4 I) : 1944-1946. ScholarBank@NUS Repository. https://doi.org/10.1109/20.951016 | Abstract: | An approach has been developed to determine the thermal stability factor (K uV*/k BT), switching volume (V*), anisotropy (K u), and dynamic coercivity (H C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO 2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data. | Source Title: | IEEE Transactions on Magnetics | URI: | http://scholarbank.nus.edu.sg/handle/10635/131605 | ISSN: | 00189464 | DOI: | 10.1109/20.951016 |
| Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
SCOPUSTM
Citations
10
checked on Feb 26, 2021
WEB OF SCIENCETM
Citations
12
checked on Feb 26, 2021
Page view(s)
51
checked on Feb 27, 2021
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.