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Please use this identifier to cite or link to this item: https://doi.org/10.1039/c4nr04184d
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dc.titleCharacterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors
dc.contributor.authorZhou H.
dc.contributor.authorKropelnicki P.
dc.contributor.authorLee C.
dc.date.accessioned2016-09-20T01:42:17Z
dc.date.available2016-09-20T01:42:17Z
dc.date.issued2015
dc.identifier.citationZhou H., Kropelnicki P., Lee C. (2015). Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors. Nanoscale 7 (2) : 532-541. ScholarBank@NUS Repository. https://doi.org/10.1039/c4nr04184d
dc.identifier.issn20403364
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/127851
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1039/c4nr04184d
dc.publisherRoyal Society of Chemistry
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1039/c4nr04184d
dc.description.sourcetitleNanoscale
dc.description.volume7
dc.description.issue2
dc.description.page532-541
dc.identifier.isiut000347245500021
dc.published.statepublished
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