Please use this identifier to cite or link to this item: https://doi.org/10.1021/jp511002b
Title: Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
Authors: Jiang Le
Sangeeth C.S.S.
Wan Albert 
Vilan Ayelet
Nijhuis Christian Albertus 
Issue Date: 2015
Publisher: American Chemical Society
Citation: Jiang Le, Sangeeth C.S.S., Wan Albert, Vilan Ayelet, Nijhuis Christian Albertus (2015). Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current. Journal of Physical Chemistry C 119 (2) : 960-969. ScholarBank@NUS Repository. https://doi.org/10.1021/jp511002b
Source Title: Journal of Physical Chemistry C
URI: http://scholarbank.nus.edu.sg/handle/10635/127557
ISSN: 19327447
DOI: 10.1021/jp511002b
Appears in Collections:Staff Publications

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