Please use this identifier to cite or link to this item:
https://doi.org/10.1021/jp511002b
| Title: | Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current | Authors: | Jiang Le Sangeeth C.S.S. Wan Albert Vilan Ayelet Nijhuis Christian Albertus |
Issue Date: | 2015 | Publisher: | American Chemical Society | Citation: | Jiang Le, Sangeeth C.S.S., Wan Albert, Vilan Ayelet, Nijhuis Christian Albertus (2015). Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current. Journal of Physical Chemistry C 119 (2) : 960-969. ScholarBank@NUS Repository. https://doi.org/10.1021/jp511002b | Source Title: | Journal of Physical Chemistry C | URI: | http://scholarbank.nus.edu.sg/handle/10635/127557 | ISSN: | 19327447 | DOI: | 10.1021/jp511002b |
| Appears in Collections: | Staff Publications |
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