Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.848426
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dc.titleOptical monitoring study on estuarine sediment incipient under marine hydrodynamic
dc.contributor.authorHao, Q.
dc.contributor.authorLi, S.
dc.contributor.authorZhang, L.
dc.date.accessioned2016-06-02T10:29:51Z
dc.date.available2016-06-02T10:29:51Z
dc.date.issued2010
dc.identifier.citationHao, Q., Li, S., Zhang, L. (2010). Optical monitoring study on estuarine sediment incipient under marine hydrodynamic. Proceedings of SPIE - The International Society for Optical Engineering 7522 : -. ScholarBank@NUS Repository. https://doi.org/10.1117/12.848426
dc.identifier.isbn9780819479129
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/125018
dc.description.abstractFor the deserted estuary without sediment inflow, ocean hydrodynamic has become the main force for coastal erosion. This paper utilizes wave-tide gauge and current meter to monitor the hydrodynamic within the experimental area and also, turbidity meter is used to conduct indirect monitoring to the sediment concentration (the corresponding relation between the turbidity value and the content of suspended particles in the water is pre-calibrated indoors). Statistical means is adopted to calculate the correlativity between the turbidity and hydropower factors, such as wave height, tide height and flow meter which are determined on site and then the determining factors for sediment incipient are obtained. The conclusion is that the eddy and turbulent flow caused by broken wave constitute the main dynamic factors for the sediment incipient and the incipient velocity mainly comes from the flow rate of the eddy and turbulence resulting from the broken wave. © 2010 SPIE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.848426
dc.sourceScopus
dc.subjectHydrodynamic
dc.subjectSediment incipient
dc.subjectTurbidity
dc.subjectYellow rive delta
dc.typeConference Paper
dc.contributor.departmentCHEMISTRY
dc.description.doi10.1117/12.848426
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume7522
dc.description.page-
dc.description.codenPSISD
dc.identifier.isiut000285572800210
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