Please use this identifier to cite or link to this item: https://doi.org/10.1111/j.1467-6494.2011.00683.x
Title: Personality Vulnerabilities to Psychopathology: Relations Between Trait Structure and Affective-Cognitive Processes
Authors: Hong, R.Y. 
Paunonen, S.V.
Issue Date: Jun-2011
Citation: Hong, R.Y., Paunonen, S.V. (2011-06). Personality Vulnerabilities to Psychopathology: Relations Between Trait Structure and Affective-Cognitive Processes. Journal of Personality 79 (3) : 527-562. ScholarBank@NUS Repository. https://doi.org/10.1111/j.1467-6494.2011.00683.x
Abstract: The present research examined (a) the relations among various affective-cognitive vulnerabilities to psychopathology, (b) the relations between vulnerabilities and dispositional traits, and (c) the mediating role of vulnerabilities between dispositional traits and psychopathological symptoms. Self-report questionnaires were administered to two independent samples in Study 1 (total N=274), whereas a longitudinal experience-sampling method was employed in Study 2 (N=100). All samples consisted of college students. Results suggested that affective-cognitive vulnerabilities showed a pattern of intercorrelations consistent with a 2-factor model representing general vulnerability to internalizing and externalizing psychopathology, respectively. The vulnerabilities also revealed common and unique aspects when mapped onto the trait structure represented by the Five-Factor Model. Most important, affective-cognitive vulnerabilities were found to constitute proximal-specific mechanisms that mediated between distal-broad dispositional vulnerabilities, such as Neuroticism, and different psychopathological symptoms. Our data support a model of personality-psychopathology relations that benefits from an integration of both the dispositional trait and social-cognitive approaches. © 2011 The Authors. Journal of Personality © 2011, Wiley Periodicals, Inc.
Source Title: Journal of Personality
URI: http://scholarbank.nus.edu.sg/handle/10635/124525
ISSN: 00223506
DOI: 10.1111/j.1467-6494.2011.00683.x
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