Please use this identifier to cite or link to this item: https://doi.org/10.1109/JSSC.2015.2408332
Title: SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS
Authors: Frustaci, Fabio
Khayatzadeh, Mahmood
Blaauw, David T.
Sylvester, Deenis M.
Alioto, Massimo Bruno 
Issue Date: 2015
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Frustaci, Fabio, Khayatzadeh, Mahmood, Blaauw, David T., Sylvester, Deenis M., Alioto, Massimo Bruno (2015). SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS. IEEE Journal of Solid-State Circuits 50 (5) : 1310-1323. ScholarBank@NUS Repository. https://doi.org/10.1109/JSSC.2015.2408332
Source Title: IEEE Journal of Solid-State Circuits
URI: http://scholarbank.nus.edu.sg/handle/10635/123449
ISSN: 00189200
DOI: 10.1109/JSSC.2015.2408332
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