Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/123201
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dc.titleMicrostructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
dc.contributor.authorKe, Qingqing
dc.contributor.authorKumar, Amit
dc.contributor.authorLou, Xiaojie
dc.contributor.authorFeng, Yuan Ping
dc.contributor.authorZeng, Kaiyang
dc.contributor.authorCai, Yongqing
dc.contributor.authorWang, John
dc.date.accessioned2016-04-29T06:03:19Z
dc.date.available2016-04-29T06:03:19Z
dc.date.issued2014
dc.identifier.citationKe, Qingqing,Kumar, Amit,Lou, Xiaojie,Feng, Yuan Ping,Zeng, Kaiyang,Cai, Yongqing,Wang, John (2014). Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films. Acta Materialia 82 : 190-197. ScholarBank@NUS Repository.
dc.identifier.issn13596454
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/123201
dc.publisherElsevier
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.sourcetitleActa Materialia
dc.description.volume82
dc.description.page190-197
dc.identifier.isiutNOT_IN_WOS
dc.published.statePublished
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