Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/123201
Title: Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
Authors: Ke, Qingqing 
Kumar, Amit
Lou, Xiaojie
Feng, Yuan Ping 
Zeng, Kaiyang 
Cai, Yongqing 
Wang, John 
Issue Date: 2014
Publisher: Elsevier
Citation: Ke, Qingqing,Kumar, Amit,Lou, Xiaojie,Feng, Yuan Ping,Zeng, Kaiyang,Cai, Yongqing,Wang, John (2014). Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films. Acta Materialia 82 : 190-197. ScholarBank@NUS Repository.
Source Title: Acta Materialia
URI: http://scholarbank.nus.edu.sg/handle/10635/123201
ISSN: 13596454
Appears in Collections:Staff Publications

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