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https://scholarbank.nus.edu.sg/handle/10635/123201
| Title: | Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films | Authors: | Ke, Qingqing Kumar, Amit Lou, Xiaojie Feng, Yuan Ping Zeng, Kaiyang Cai, Yongqing Wang, John |
Issue Date: | 2014 | Publisher: | Elsevier | Citation: | Ke, Qingqing,Kumar, Amit,Lou, Xiaojie,Feng, Yuan Ping,Zeng, Kaiyang,Cai, Yongqing,Wang, John (2014). Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films. Acta Materialia 82 : 190-197. ScholarBank@NUS Repository. | Source Title: | Acta Materialia | URI: | http://scholarbank.nus.edu.sg/handle/10635/123201 | ISSN: | 13596454 |
| Appears in Collections: | Staff Publications |
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