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|Title:||Imaging the local ideality factor by contactless photoluminescence measurement||Authors:||Hameiri, Z.
|Issue Date:||8-Jul-2013||Citation:||Hameiri, Z., Chaturvedi, P., McIntosh, K.R. (2013-07-08). Imaging the local ideality factor by contactless photoluminescence measurement. Applied Physics Letters 103 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4812835||Abstract:||A contactless method to image the local ideality factor of silicon wafers and silicon solar cells is introduced. The method is based on photoluminescence imaging and can be applied throughout the solar cell fabrication process, even before junction formation. The local ideality factor measured by the proposed method is found to be in good agreement with that measured by Suns-V oc. Examples of its application are given for fully and partially fabricated solar cells. © 2013 AIP Publishing LLC.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/117043||ISSN:||00036951||DOI:||10.1063/1.4812835|
|Appears in Collections:||Staff Publications|
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