Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3054181
DC FieldValue
dc.titleA broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method
dc.contributor.authorChen, X.
dc.contributor.authorMa, Y.
dc.contributor.authorXu, F.
dc.contributor.authorWang, P.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-12-12T07:58:57Z
dc.date.available2014-12-12T07:58:57Z
dc.date.issued2009
dc.identifier.citationChen, X., Ma, Y., Xu, F., Wang, P., Ong, C.K. (2009). A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method. Journal of Applied Physics 105 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3054181
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/116900
dc.description.abstractIn this paper, the microwave characteristics of a FeTaN lamination stack are studied with a shorted microstrip line method. The FeTaN lamination stack was fabricated by gluing 54 layers of FeTaN units with epoxy together. The FeTaN units were deposited on both sides of an 8 μm polyethylene terephthate (Mylar) film as the substrate by rf magnetron sputtering. On each side of the Mylar substrate, three 100-nm FeTaN layers are laminated with two 8 nm Al 2O3 layers. The complex permeability of FeTaN lamination stack is calculated by the scattering parameters using the shorted load transmission line model based on the quasi-transverse-electromagnetic approximation. A full wave analysis combined with an optimization process is employed to determine the accurate effective permeability values. The optimized complex permeability data can be used for the microwave filter design. © 2009 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3054181
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentTEMASEK LABORATORIES
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.3054181
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume105
dc.description.issue1
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000262534100098
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

3
checked on Jul 19, 2019

WEB OF SCIENCETM
Citations

3
checked on Jul 19, 2019

Page view(s)

145
checked on Jul 19, 2019

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.