Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1555365
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dc.titleEvolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films
dc.contributor.authorNie, H.B.
dc.contributor.authorOng, C.K.
dc.contributor.authorWang, J.P.
dc.contributor.authorLi, Z.W.
dc.date.accessioned2014-12-12T07:36:03Z
dc.date.available2014-12-12T07:36:03Z
dc.date.issued2003-05-15
dc.identifier.citationNie, H.B., Ong, C.K., Wang, J.P., Li, Z.W. (2003-05-15). Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films. Journal of Applied Physics 93 (10 2) : 7252-7254. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1555365
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/116074
dc.description.abstractThe evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1555365
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentTEMASEK LABORATORIES
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.1555365
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume93
dc.description.issue10 2
dc.description.page7252-7254
dc.description.codenJAPIA
dc.identifier.isiut000182822300276
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