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|Title:||Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films||Authors:||Nie, H.B.
|Issue Date:||15-May-2003||Citation:||Nie, H.B., Ong, C.K., Wang, J.P., Li, Z.W. (2003-05-15). Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films. Journal of Applied Physics 93 (10 2) : 7252-7254. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1555365||Abstract:||The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/116074||ISSN:||00218979||DOI:||10.1063/1.1555365|
|Appears in Collections:||Staff Publications|
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