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|Title:||Self-assembly growth and structure study of BiFeO3-CoFe 2O4 nanostructure film||Authors:||Song, Q.
|Issue Date:||2010||Citation:||Song, Q., Zhang, X.Y., Ong, C.K. (2010). Self-assembly growth and structure study of BiFeO3-CoFe 2O4 nanostructure film. Journal of Physics: Conference Series 200 (SECTION 7) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/1742-6596/200/7/072092||Abstract:||Pulsed laser deposition method was used to prepare (0.67) BiFeO 3- (0.33) CoFe2O4 nanostructure thin film. The XRD analysis shows that lower growth temperature will not obtain separation of BiFeO3 and CoFe2O4 phase. Post-annealing treatment will induce the phase separation. XRD data and SEM image both confirm these phase separation. © 2010 IOP Publishing Ltd.||Source Title:||Journal of Physics: Conference Series||URI:||http://scholarbank.nus.edu.sg/handle/10635/115490||ISSN:||17426588||DOI:||10.1088/1742-6596/200/7/072092|
|Appears in Collections:||Staff Publications|
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