Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/115393
Title: Circuit performance and yield optimization with worst-case and Monte Carlo analyses
Authors: Lan, C.S.
Wenjun, Z. 
Tao, K.
Qing, G.
Issue Date: 1997
Citation: Lan, C.S.,Wenjun, Z.,Tao, K.,Qing, G. (1997). Circuit performance and yield optimization with worst-case and Monte Carlo analyses. International Symposium on IC Technology, Systems and Applications 7 : 653-655. ScholarBank@NUS Repository.
Abstract: This paper proposes a methodology for analog circuit performance and production yield optimization with the assistance of worst-case analysis and Monte Carlo simulation. Experimental results with a new commercial circuit is presented. Compared with the initial circuit, our optimized circuit is much more stable and has almost 100% predicted yield. Our work shows that Monte Carlo analysis can provide useful information to guide a designer in determining the nominal values as well as tolerance of circuit components so that an optimal design and required production yield can be obtained.
Source Title: International Symposium on IC Technology, Systems and Applications
URI: http://scholarbank.nus.edu.sg/handle/10635/115393
Appears in Collections:Staff Publications

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