Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/114864
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dc.titleA graphical approach to obtaining confidence limits of C pk
dc.contributor.authorTang, L.C.
dc.contributor.authorThan, S.E.
dc.contributor.authorAng, B.W.
dc.date.accessioned2014-12-12T07:04:07Z
dc.date.available2014-12-12T07:04:07Z
dc.date.issued1997
dc.identifier.citationTang, L.C.,Than, S.E.,Ang, B.W. (1997). A graphical approach to obtaining confidence limits of C pk. Quality and Reliability Engineering International 13 (6) : 337-346. ScholarBank@NUS Repository.
dc.identifier.issn07488017
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/114864
dc.description.abstractThe process capability index C pk has been widely used as a process performance measure. In practice this index is estimated using sample data. Hence it is of great interest to obtain confidence limits for the actual index given a sample estimate. In this paper we depict graphically the relationship between process potential index (C p), process shift index (k) and percentage non-conforming (p). Based on the monotone properties of the relationship, we derive two-sided confidence limits for k and C pk under two different scenarios. These two limits are combined using the Bonferroni inequality to generate a third type of confidence limit. The performance of these limits of C pk in terms of their coverage probability and average width is evaluated by simulation. The most suitable type of confidence limit for each specific range of k is then determined. The usage of these confidence limits is illustrated via examples. Finally a performance comparison is done between the proposed confidence limits and three non-parametric bootstrap confidence limits. The results show that the proposed method consistently gives the smallest width and yet provides the intended coverage probability. © 1997 John Wiley & Sons, Ltd.
dc.sourceScopus
dc.subjectProcess capability analysis: C pkConfidence interval
dc.subjectSix sigma
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.sourcetitleQuality and Reliability Engineering International
dc.description.volume13
dc.description.issue6
dc.description.page337-346
dc.description.codenQREIE
dc.identifier.isiutNOT_IN_WOS
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