Please use this identifier to cite or link to this item:
https://doi.org/10.1109/VTSA.2009.5159316
DC Field | Value | |
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dc.title | A new robust non-local algorithm for band-to-band tunneling simulation and its application to tunnel-FET | |
dc.contributor.author | Shen, C. | |
dc.contributor.author | Yang, L.T. | |
dc.contributor.author | Toh, E.-H. | |
dc.contributor.author | Heng, C.-H. | |
dc.contributor.author | Samudra, G.S. | |
dc.contributor.author | Yeo, Y.-C. | |
dc.date.accessioned | 2014-12-02T08:05:49Z | |
dc.date.available | 2014-12-02T08:05:49Z | |
dc.date.issued | 2009 | |
dc.identifier.citation | Shen, C., Yang, L.T., Toh, E.-H., Heng, C.-H., Samudra, G.S., Yeo, Y.-C. (2009). A new robust non-local algorithm for band-to-band tunneling simulation and its application to tunnel-FET. International Symposium on VLSI Technology, Systems, and Applications, Proceedings : 113-114. ScholarBank@NUS Repository. https://doi.org/10.1109/VTSA.2009.5159316 | |
dc.identifier.isbn | 9781424427857 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/114537 | |
dc.description.abstract | A new non-local algorithm for accurately calculating the band-to-band tunneling current suitable for TCAD semiconductor simulators is proposed in this abstract. The proposed algorithm captures the essential physics of multi-dimensional tunneling in a 2D structure, and is designed to be robust and to achieve independence on the mesh grid. The new algorithm enables accurate modeling of T-FET and investigation of its device physics. Application on T-FET is demonstrated. The physical origin of the saturation of Id-V d curve of T-FET is analyzed and clarified for the first time. ©2009 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/VTSA.2009.5159316 | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/VTSA.2009.5159316 | |
dc.description.sourcetitle | International Symposium on VLSI Technology, Systems, and Applications, Proceedings | |
dc.description.page | 113-114 | |
dc.identifier.isiut | 000272451000050 | |
Appears in Collections: | Staff Publications |
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