Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0167-9317(02)01022-5
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dc.titleFerroelectric Pb(Mg1/3Nb2/3)O3 thin films by PLD at varying oxygen pressures
dc.contributor.authorGao, X.S.
dc.contributor.authorXue, J.M.
dc.contributor.authorLi, J.
dc.contributor.authorOng, C.K.
dc.contributor.authorWang, J.
dc.date.accessioned2014-11-28T09:12:11Z
dc.date.available2014-11-28T09:12:11Z
dc.date.issued2003-04
dc.identifier.citationGao, X.S., Xue, J.M., Li, J., Ong, C.K., Wang, J. (2003-04). Ferroelectric Pb(Mg1/3Nb2/3)O3 thin films by PLD at varying oxygen pressures. Microelectronic Engineering 66 (1-4) : 926-932. ScholarBank@NUS Repository. https://doi.org/10.1016/S0167-9317(02)01022-5
dc.identifier.issn01679317
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/113114
dc.description.abstractOxygen deposition pressure exerts a strong impact on the structure and ferroelectric properties of Pb(Mg1/3Nb2/3)O3 (PMN) thin films derived from pulsed laser ablation (PLD), when perovskite PMN films on (La1/3Sr2/3)MnO3/LaAlO3 substrates were deposited at 520°C and oxygen pressure varied from 0.1 to 0.6 mbar. Instead of showing the cubic structure of bulk ceramic PMN, the films exhibit a tetragonal structure, as confirmed by the splitting of (002) diffraction peak into (002) and (200) peaks. The intensity ratio of (002) and (200) increases with decreasing oxygen partial pressure. Both the remnant polarization and dielectric constant of the PMN thin films increase with decreasing deposition oxygen pressure. This is attributed to the enhancement of c-domains, which exhibit a larger polarization than that of a-domains. Typical depressed semicircles were observed in Cole-Cole curves, suggesting the coexistence of polarization relaxation and space charge relaxation in the oxygen deficient PMN films. © 2002 Elsevier Science B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0167-9317(02)01022-5
dc.sourceScopus
dc.subjectFerroelectric properties
dc.subjectPb(Mg1/3Nb2/3)O3 thin films
dc.subjectPulsed laser deposition (PLD)
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE
dc.contributor.departmentPHYSICS
dc.contributor.departmentINSTITUTE OF ENGINEERING SCIENCE
dc.description.doi10.1016/S0167-9317(02)01022-5
dc.description.sourcetitleMicroelectronic Engineering
dc.description.volume66
dc.description.issue1-4
dc.description.page926-932
dc.description.codenMIENE
dc.identifier.isiut000182725500138
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