Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.elspec.2005.01.256
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dc.titleNew soft X-ray facility SINS for surface and nanoscale science at SSLS
dc.contributor.authorYu, X.
dc.contributor.authorWilhelmi, O.
dc.contributor.authorMoser, H.O.
dc.contributor.authorVidyaraj, S.V.
dc.contributor.authorGao, X.
dc.contributor.authorWee, A.T.S.
dc.contributor.authorNyunt, T.
dc.contributor.authorQian, H.
dc.contributor.authorZheng, H.
dc.date.accessioned2014-11-28T08:43:48Z
dc.date.available2014-11-28T08:43:48Z
dc.date.issued2005-06
dc.identifier.citationYu, X., Wilhelmi, O., Moser, H.O., Vidyaraj, S.V., Gao, X., Wee, A.T.S., Nyunt, T., Qian, H., Zheng, H. (2005-06). New soft X-ray facility SINS for surface and nanoscale science at SSLS. Journal of Electron Spectroscopy and Related Phenomena 144-147 : 1031-1034. ScholarBank@NUS Repository. https://doi.org/10.1016/j.elspec.2005.01.256
dc.identifier.issn03682048
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/113058
dc.description.abstractThe first soft X-ray facility at the Singapore Synchrotron Light Source was built by FMB and commissioned in 2003. Dubbed SINS for surface, interface, and nanostructure science, it covers a photon energy range from 50 to 1200 eV. The photon beam can be set to left circular, right circular or linear polarization by changing the pitch and vertical position of the vertical focusing mirror of the prefocusing optics. The typical resolution (E/ΔE) and flux are about 1000 at 1010 photons/s or exceeding 4000 at 108 photons/s in a spot of about 1.5 mm × 0.2 mm on the sample. The performance of the beamline was measured using gas photoionization spectra of Ar, He, Kr, and N2 as well as an XMCD spectrum of a Ni sample. From the Ni XMCD signal, calculation shows that the degree of circular polarization can reach 95% at 850 eV photon energy. The end-station is presently equipped with a hemispherical electron energy analyzer and typical surface science diagnostics including LEED and ion sputtering. Upgrading with an in situ STM/AFM and a growth chamber is underway which will make SINS a unique tool for in situ surface and nanoscale science studies. © 2005 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.elspec.2005.01.256
dc.sourceScopus
dc.subjectBeamline
dc.subjectMonochromator
dc.subjectPhotoemission
dc.subjectSINS
dc.subjectXMCD
dc.typeConference Paper
dc.contributor.departmentPHYSICS
dc.contributor.departmentSINGAPORE SYNCHROTRON LIGHT SOURCE
dc.description.doi10.1016/j.elspec.2005.01.256
dc.description.sourcetitleJournal of Electron Spectroscopy and Related Phenomena
dc.description.volume144-147
dc.description.page1031-1034
dc.description.codenJESRA
dc.identifier.isiut000229657100242
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