Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0304-3991(00)00019-X
Title: Use of the track structure approach in TEM
Authors: Bourdillon, A.J. 
Keywords: Electron energy-loss
Impact parameter
TEM
Issue Date: Jun-2000
Citation: Bourdillon, A.J. (2000-06). Use of the track structure approach in TEM. Ultramicroscopy 83 (3-4) : 261-264. ScholarBank@NUS Repository. https://doi.org/10.1016/S0304-3991(00)00019-X
Abstract: Track structures can be usefully used to understand concepts and measurements not adequately treated by conventional scattering theory using the Born approximation. An example is the impact parameter used experimentally in energy-loss and energy-dispersive spectroscopies in the transmission electron microscope. An anomaly is discussed which derives from the wave-particle duality in quantum mechanics in the context of near relativistic speeds encountered in the electron microscope. Copyright (C) 2000 Elsevier Science B.V.
Source Title: Ultramicroscopy
URI: http://scholarbank.nus.edu.sg/handle/10635/113046
ISSN: 03043991
DOI: 10.1016/S0304-3991(00)00019-X
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