Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.nimb.2006.09.014
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dc.titleSecondary electron emission properties of III-nitride/ZnO coaxial heterostructures under ion and X-ray bombardment
dc.contributor.authorCholewa, M.
dc.contributor.authorMoser, H.O.
dc.contributor.authorHuang, L.
dc.contributor.authorLau, S.P.
dc.contributor.authorYoo, J.
dc.contributor.authorAn, S.J.
dc.contributor.authorYi, G.-C.
dc.contributor.authorXingyu, G.
dc.contributor.authorWee, A.T.S.
dc.contributor.authorBettiol, A.
dc.contributor.authorWatt, F.
dc.contributor.authorFischer, B.
dc.date.accessioned2014-11-28T08:43:33Z
dc.date.available2014-11-28T08:43:33Z
dc.date.issued2007-01
dc.identifier.citationCholewa, M., Moser, H.O., Huang, L., Lau, S.P., Yoo, J., An, S.J., Yi, G.-C., Xingyu, G., Wee, A.T.S., Bettiol, A., Watt, F., Fischer, B. (2007-01). Secondary electron emission properties of III-nitride/ZnO coaxial heterostructures under ion and X-ray bombardment. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 254 (1) : 55-58. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2006.09.014
dc.identifier.issn0168583X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/113038
dc.description.abstractThe secondary electron emission (SEE) yield of heterostructures of zinc oxide (ZnO) nanoneedles coaxially coated with aluminum nitride (AlN) or gallium nitride (GaN) has been studied using ion and X-ray beams. This paper describes experiments performed with ions (2 MeV protons and 3.6 MeV/nucleon carbon beams) and photons (synchrotron radiation at ≈1 keV). The SEE yield of the heterostructures is enhanced significantly by the intrinsic nanostructure of the ZnO nanoneedle templates as compared to the AlN and GaN thin films on silicon (Si) substrates [T.J. Vink, R.G.F.A. Verbeek, V. Elsbergen, P.K. Bachmann, Appl. Phys. Lett. 83 (2003) 2285]. One of the mechanisms responsible for SEE yield enhancement can be attributed to the larger area of the nanostructured surface. © 2006 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.nimb.2006.09.014
dc.sourceScopus
dc.subjectNanomaterials
dc.subjectRadiation detectors
dc.subjectSecondary electron production
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentSINGAPORE SYNCHROTRON LIGHT SOURCE
dc.description.doi10.1016/j.nimb.2006.09.014
dc.description.sourcetitleNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
dc.description.volume254
dc.description.issue1
dc.description.page55-58
dc.description.codenNIMBE
dc.identifier.isiut000243826400009
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