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|Title:||Detecting underfill delamination and cracks in flip chip on board assemblies using infrared microscope||Authors:||Lu, J.
|Issue Date:||Sep-1998||Citation:||Lu, J.,Trigg, A.,Wu, J.,Chai, T. (1998-09). Detecting underfill delamination and cracks in flip chip on board assemblies using infrared microscope. International Journal of Microcircuits and Electronic Packaging 21 (3) : 231-236. ScholarBank@NUS Repository.||Abstract:||Infrared Microscopy (IRM) inspection of underfill delamination and cracks in Flip Chip board (FCOB) assemblies is reported in this work. The location and extent of chip/underfill delamination has been determined. Internal cracks in underfill can also be detected by IRM. Compared to scanning acoustic microscopy (SAM), IRM technique provides higher resolution images of underfill related failures and eliminates the `edge effect' which occurs in SAM. Underfill failures detected by IRM have been verified by destructive physical analysis, microscopy, and scanning electronic microscopy (SEM).||Source Title:||International Journal of Microcircuits and Electronic Packaging||URI:||http://scholarbank.nus.edu.sg/handle/10635/112963||ISSN:||10631674|
|Appears in Collections:||Staff Publications|
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