Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/42/1/015501
Title: Characterization of microwave dielectric properties of ferroelectric parallel plate varactors
Authors: Sheng, S.
Wang, P. 
Zhang, X.Y. 
Ong, C.K. 
Issue Date: Jan-2009
Citation: Sheng, S., Wang, P., Zhang, X.Y., Ong, C.K. (2009-01). Characterization of microwave dielectric properties of ferroelectric parallel plate varactors. Journal of Physics D: Applied Physics 42 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/42/1/015501
Abstract: A procedure to accurately evaluate microwave dielectric properties of parallel plate varactors fabricated on a BST thin film deposited by pulsed laser deposition on a platinized silicon substrate is presented. The reliability of the high-frequency properties of dielectric thin films extracted from the measured reflection coefficient S11 is mainly limited by how accurately the parasitic effects are eliminated from the measured data. The parasitic effects were effectively removed on evaluating the thin-film dielectric properties based on the good agreement between the experimental results measured with the parasitic model and the computer simulation data. © 2009 IOP Publishing Ltd.
Source Title: Journal of Physics D: Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/111342
ISSN: 00223727
DOI: 10.1088/0022-3727/42/1/015501
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

19
checked on Aug 19, 2019

WEB OF SCIENCETM
Citations

16
checked on Jul 5, 2019

Page view(s)

106
checked on Aug 16, 2019

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.