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|Title:||Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films||Authors:||Sun, C.J.
|Issue Date:||15-May-2003||Citation:||Sun, C.J., Chow, G.M., Wang, J.P., Soo, E.W., Je, J.H. (2003-05-15). Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films. Journal of Applied Physics 93 (10 3) : 8725-8727. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1540133||Abstract:||The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/107284||ISSN:||00218979||DOI:||10.1063/1.1540133|
|Appears in Collections:||Staff Publications|
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