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Title: Structural Effects of Ti Underlayer on CoCrPt Magnetic Films
Authors: Sun, C.J. 
Chow, G.M. 
Soo, E.W.
Wang, J.P.
Hwu, Y.K.
Cho, T.S.
Je, J.H.
Lee, H.H.
Kim, J.W.
Noh, D.Y.
Keywords: Cocrpt films
Ti underlayer
X-ray scattering
Issue Date: 2001
Citation: Sun, C.J., Chow, G.M., Soo, E.W., Wang, J.P., Hwu, Y.K., Cho, T.S., Je, J.H., Lee, H.H., Kim, J.W., Noh, D.Y. (2001). Structural Effects of Ti Underlayer on CoCrPt Magnetic Films. Journal of Nanoscience and Nanotechnology 1 (3) : 271-273. ScholarBank@NUS Repository.
Abstract: The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co 72Cr 21 Pt 7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.
Source Title: Journal of Nanoscience and Nanotechnology
ISSN: 15334880
DOI: 10.1166/jnn.2001.035
Appears in Collections:Staff Publications

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