Please use this identifier to cite or link to this item:
https://doi.org/10.1109/TR.2002.1011523
DC Field | Value | |
---|---|---|
dc.title | A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests | |
dc.contributor.author | Teng, S.-L. | |
dc.contributor.author | Yeo, K.-P. | |
dc.date.accessioned | 2014-10-28T05:16:35Z | |
dc.date.available | 2014-10-28T05:16:35Z | |
dc.date.issued | 2002-06 | |
dc.identifier.citation | Teng, S.-L., Yeo, K.-P. (2002-06). A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests. IEEE Transactions on Reliability 51 (2) : 177-182. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2002.1011523 | |
dc.identifier.issn | 00189529 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/105468 | |
dc.description.abstract | A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: 1) provides closed-form parameter estimates;, 2) motivates a simple statistic for life-stress relationship verification; and 3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TR.2002.1011523 | |
dc.source | Scopus | |
dc.subject | D-statistic | |
dc.subject | Exponential distribution | |
dc.subject | Step-stress accelerated life test | |
dc.subject | Transformed least squares estimation method | |
dc.type | Conference Paper | |
dc.contributor.department | STATISTICS & APPLIED PROBABILITY | |
dc.description.doi | 10.1109/TR.2002.1011523 | |
dc.description.sourcetitle | IEEE Transactions on Reliability | |
dc.description.volume | 51 | |
dc.description.issue | 2 | |
dc.description.page | 177-182 | |
dc.description.coden | IEERA | |
dc.identifier.isiut | 000176340900011 | |
Appears in Collections: | Staff Publications |
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