Publication

Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures

You, D.
Liu, Z.
Guo, Z.
Zheng, Y.
Wu, Y.
Citations
Altmetric:
Alternative Title
Abstract
The effect of milling process on the magnetic properties of focused ion beam (FIB) patterned magnetic nanostructures was discussed. The dipole structures for the magnetic dots were observed. The effect of milling direction on the redeposition was investigated and it was found that the redeposition formed even when the two milling direction are not perpendicular to each other.
Keywords
Source Title
Digests of the Intermag Conference
Publisher
Series/Report No.
Organizational Units
Organizational Unit
Rights
Date
2002
DOI
Type
Conference Paper
Additional Links
Related Datasets
Related Publications