Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures
You, D. ; Liu, Z. ; Guo, Z. ; Zheng, Y. ; Wu, Y.
You, D.
Liu, Z.
Guo, Z.
Zheng, Y.
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Abstract
The effect of milling process on the magnetic properties of focused ion beam (FIB) patterned magnetic nanostructures was discussed. The dipole structures for the magnetic dots were observed. The effect of milling direction on the redeposition was investigated and it was found that the redeposition formed even when the two milling direction are not perpendicular to each other.
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Digests of the Intermag Conference
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Date
2002
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Conference Paper