An integrated software of optical system and media design
Lim, K.G. ; Shi, L.P. ; Li, J.M. ; Miao, X.S. ; Tan, W.L. ; Yang, H.X. ; Lim, Y.B. ; Yuan, G.Q. ; Chong, T.C.
Lim, K.G.
Shi, L.P.
Li, J.M.
Miao, X.S.
Tan, W.L.
Yang, H.X.
Lim, Y.B.
Yuan, G.Q.
Citations
Altmetric:
Alternative Title
Abstract
An integrated analysis tool of optical system and media which combines system with media analysis of the discs is developed in this project. This software has been used to study the influence of disc tilt, cover layer thickness and scratches on high density recording, which show that it provides a powerful tool in practical applications.
Keywords
Cover layer thickness, Disc tilt, Integrated analysis, Optical media, Optical system, Scratches
Source Title
Proceedings of SPIE - The International Society for Optical Engineering
Publisher
Series/Report No.
Collections
Rights
Date
2007
DOI
10.1117/12.738640
Type
Conference Paper