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0.5um EEPROM CHARACTERIZATION

SEOW KIAN CHIEW
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Abstract
This dissertation describes the characterization of various test structures used in the 0.5um Electrically Erasable Programmable Read Only Memory (EEPROM) 0.5um devices.
Keywords
Electrically Erasable Programmable Read Only Memory, EEPROM, Test structure
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Master's Theses (Restricted)
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Date
2007
URI
https://scholarbank.nus.edu.sg/handle/10635/153909
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Type
Thesis
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